Alloying and annealing effects on grain boundary character evolution of al-alloy 7075 thin films: An ACOM-TEM analysis

Prakash Parajuli, Rubén Mendoza-Cruz, Miguel José Yacamán, Arturo Ponce

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Scopus citations

Abstract

Since polycrystalline materials consist of a complex network of various types of grain boundaries (GBs), a detailed study on the types of the GBs, their distribution and how they are connected is crucial to further enhance the material’s performance. Herein, the GB character distribution (types and connectivity) of as-deposited Al and Al-alloy 7075 thin films, as well as annealed Al-alloy thin films, was investigated using an advanced microscopic technique: ACOM-TEM. Annealing processes up to 12 h caused a decrease in the content ratio of random high-angle GBs (r-HAGBs) and triple junctions comprised of r-HAGBs. However, there was no significant consequence of alloying in the GB type and connectivity distribution. Furthermore, our results indicate that vacuum-deposited Al or Al-alloy thin films possess a strong <111> texture, and a characteristic GB distribution consisting of a significantly high fraction of low coincidence site lattice GBs (predominant ∑1 followed by ∑13b, ∑7, ∑21a, ∑31a and ∑19b in descending order) and a minor fraction of r-HAGBs.

Original languageEnglish (US)
Title of host publicationMinerals, Metals and Materials Series
PublisherSpringer International Publishing
Pages109-119
Number of pages11
DOIs
StatePublished - 2019
Externally publishedYes

Publication series

NameMinerals, Metals and Materials Series
ISSN (Print)2367-1181
ISSN (Electronic)2367-1696

Keywords

  • ACOM-TEM
  • Alloying
  • Annealing
  • Grain boundaries
  • Thin films
  • Triple junction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Energy Engineering and Power Technology
  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

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