Abstract
The characterization of nanoparticles is of prime importance in many fields of materials science. High-resolution electron microscopy coupled with image processing has produced new information on the structure of such particles. In this paper we discuss the possibility of applying these techniques to the study of surface roughness.
Original language | English (US) |
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Pages (from-to) | 240-244 |
Number of pages | 5 |
Journal | Materials Chemistry and Physics |
Volume | 41 |
Issue number | 4 |
DOIs | |
State | Published - Sep 1995 |
Externally published | Yes |
Keywords
- High-resolution electron microscopy
- Image processing
- Nanoparticles
- Surface roughness
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics