Advanced characterization of nanoparticles: experimental evidence of surface roughness

Gabriela Díaz, Miguel José-Yacamán

Research output: Contribution to journalReview articlepeer-review

2 Scopus citations

Abstract

The characterization of nanoparticles is of prime importance in many fields of materials science. High-resolution electron microscopy coupled with image processing has produced new information on the structure of such particles. In this paper we discuss the possibility of applying these techniques to the study of surface roughness.

Original languageEnglish (US)
Pages (from-to)240-244
Number of pages5
JournalMaterials Chemistry and Physics
Volume41
Issue number4
DOIs
StatePublished - Sep 1995
Externally publishedYes

Keywords

  • High-resolution electron microscopy
  • Image processing
  • Nanoparticles
  • Surface roughness

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics

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