Aberration-corrected electron microscopy of nanoparticles

Miguel José Yacamán; Ulises Santiago; Sergio Mejía-Rosales

doi:10.1007/978-3-319-15177-9_1

Aberration-corrected electron microscopy of nanoparticles

Miguel José Yacamán, Ulises Santiago, Sergio Mejía-Rosales

Research output: Chapter in Book/Report/Conference proceeding › Chapter

5 Scopus citations

Abstract

The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique.

Original language	English (US)
Title of host publication	Advanced Transmission Electron Microscopy
Subtitle of host publication	Applications to Nanomaterials
Publisher	Springer International Publishing
Pages	1-30
Number of pages	30
ISBN (Electronic)	9783319151779
ISBN (Print)	9783319151762
DOIs	https://doi.org/10.1007/978-3-319-15177-9_1
State	Published - Jan 1 2015
Externally published	Yes

ASJC Scopus subject areas

General Engineering
General Materials Science
General Biochemistry, Genetics and Molecular Biology

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10.1007/978-3-319-15177-9_1

Cite this

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Aberration-corrected electron microscopy of nanoparticles

Abstract

ASJC Scopus subject areas

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