A versatile test bench for wireless RF/microwave component characterization

Wrence P. Dunleavy, Thomas M. Weller, Paul G. Flikkema, Horace C. Gordon, Rudolf E. Henning

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.

Original languageEnglish (US)
Pages (from-to)304-312
Number of pages9
JournalMicrowave Journal
Issue number5
StatePublished - May 1998

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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