A versatile test bench for wireless RF/microwave component characterization

Wrence P. Dunleavy; Thomas M. Weller; Paul G. Flikkema; Horace C. Gordon; Rudolf E. Henning

A versatile test bench for wireless RF/microwave component characterization

Wrence P. Dunleavy, Thomas M. Weller, Paul G. Flikkema, Horace C. Gordon, Rudolf E. Henning

Informatics, Computing, and Cyber Systems, School of

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.

Original language	English (US)
Pages (from-to)	304-312
Number of pages	9
Journal	Microwave Journal
Volume	41
Issue number	5
State	Published - May 1998

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{513b2ba3d5f6435ea672abc5a67998e9,

title = "A versatile test bench for wireless RF/microwave component characterization",

abstract = "Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.",

author = "Dunleavy, {Wrence P.} and Weller, {Thomas M.} and Flikkema, {Paul G.} and Gordon, {Horace C.} and Henning, {Rudolf E.}",

year = "1998",

month = may,

language = "English (US)",

volume = "41",

pages = "304--312",

journal = "Microwave Journal",

issn = "0192-6225",

publisher = "Horizon House",

number = "5",

}

TY - JOUR

T1 - A versatile test bench for wireless RF/microwave component characterization

AU - Dunleavy, Wrence P.

AU - Weller, Thomas M.

AU - Flikkema, Paul G.

AU - Gordon, Horace C.

AU - Henning, Rudolf E.

PY - 1998/5

Y1 - 1998/5

N2 - Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.

AB - Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.

UR - http://www.scopus.com/inward/record.url?scp=11644250162&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=11644250162&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:11644250162

SN - 0192-6225

VL - 41

SP - 304

EP - 312

JO - Microwave Journal

JF - Microwave Journal

IS - 5

ER -

A versatile test bench for wireless RF/microwave component characterization

Abstract

ASJC Scopus subject areas

Other files and links

Fingerprint

Cite this