Abstract
Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum analyzer (SA) and signal source is described, along with test techniques for a wide range of RF/microwave measurements in the 0.3 to 3 GHz frequency range.
Original language | English (US) |
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Pages (from-to) | 304-312 |
Number of pages | 9 |
Journal | Microwave Journal |
Volume | 41 |
Issue number | 5 |
State | Published - May 1998 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering