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A study of the interfacial resistive switching mechanism by proton exchange reactions on the SiOx layer
- Fei Zhou
- , Yao Feng Chang
- , Ying Chen Chen
- , Xiaohan Wu
- , Ye Zhang
- , Burt Fowler
- , Jack C. Lee
Research output: Contribution to journal › Article › peer-review
23
Scopus
citations