A novel clustering and declustering algorithm for fuzzy classification of wafer defects

Tarek A. El Doker, David R. Scott

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'A novel clustering and declustering algorithm for fuzzy classification of wafer defects'. Together they form a unique fingerprint.

Engineering & Materials Science