A direct comparison of exoEarth yields for starshades and coronagraphs

Christopher C. Stark, Eric J. Cady, Mark Clampin, Shawn Domagal-Goldman, Doug Lisman, Avi M. Mandell, Michael W. McElwain, Aki Roberge, Tyler D. Robinson, Dmitry Savransky, Stuart B. Shaklan, Karl R. Stapelfeldt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

The scale and design of a future mission capable of directly imaging extrasolar planets will be influenced by the detectable number (yield) of potentially Earth-like planets. Currently, coronagraphs and starshades are being considered as instruments for such a mission. We will use a novel code to estimate and compare the yields for starshade- and coronagraph-based missions. We will show yield scaling relationships for each instrument and discuss the impact of astrophysical and instrumental noise on yields. Although the absolute yields are dependent on several yet-unknown parameters, we will present several limiting cases allowing us to bound the yield comparison.

Original languageEnglish (US)
Title of host publicationSpace Telescopes and Instrumentation 2016
Subtitle of host publicationOptical, Infrared, and Millimeter Wave
EditorsHoward A. MacEwen, Makenzie Lystrup, Giovanni G. Fazio
PublisherSPIE
ISBN (Electronic)9781510601871
DOIs
StatePublished - 2016
Externally publishedYes
EventSpace Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave - Edinburgh, United Kingdom
Duration: Jun 26 2016Jul 1 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9904
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSpace Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
Country/TerritoryUnited Kingdom
CityEdinburgh
Period6/26/167/1/16

Keywords

  • Methods:numerical
  • Planetary systems
  • Telescopes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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