A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices

C. Y. Lin, P. H. Chen, T. C. Chang, W. C. Huang, Y. F. Tan, Y. H. Lin, W. C. Chen, C. C. Lin, Y. F. Chang, Y. C. Chen, H. C. Huang, X. H. Ma, Y. Hao, S. M. Sze

Research output: Contribution to journal › Article › peer-review