A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices
- C. Y. Lin
- , P. H. Chen
- , T. C. Chang
- , W. C. Huang
- , Y. F. Tan
- , Y. H. Lin
- , W. C. Chen
- , C. C. Lin
- , Y. F. Chang
- , Y. C. Chen
- , H. C. Huang
- , X. H. Ma
- , Y. Hao
- , S. M. Sze
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